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Infineon Technologies S26KS128SDABHB030 — Memory (DRAM / SRAM / Flash / EEPROM)

Infineon S26KS128SDABHB030 HyperFlash™ 128Mbit NOR, AEC-Q100

MPNS26KS128SDABHB030
Active

Infineon Technologies HyperFlash™ KS series, 128Mbit parallel NOR flash, 96 ns access time, 100 MHz, 1.7 V supply, AEC-Q100 automotive qualified, -40 to +105°C, 24-FBGA package, S26KS128SDABHB030.

$6.47Ref. price · indicative, final on quote
Independent supplier — new & surplus stockAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

S26KS128SDABHB030 specifications
ParameterValue
SeriesHyperFlash™ KS
InterfaceParallel
MountingSurface Mount
Operating temperature high-40°C to 105°C (TA)
GradeAutomotive
Frame_size128Mbit
Access time96 ns
Memory typeNon-Volatile
Frequency100000000.0
Package_typeBulk
Memory formatFLASH
QualificationAEC-Q100
StatusActive
Supply voltage1.7
Memory organization16M x 8

Product details

128 Mbit parallel NOR flash for automotive code-shadowing

The S26KS128SDABHB030: The 1.7 V core supply and AEC-Q100 qualification target automotive ECU designs where code executes directly from flash (XIP) or shadows to RAM at power-up.

AEC-Q100 grade and thermal envelope

Qualified to AEC-Q100, the part meets the stress, reliability, and PPAP requirements for automotive supply chains — engine control units, transmission controllers, and chassis-domain modules.

Parallel interface and board-fit considerations

The 24-ball FBGA package (0.80 mm pitch typical for this density class) routes to a standard parallel NOR flash footprint. The byte-wide 8-bit data bus matches the memory controller on many automotive MCUs and MPUs — no need for a serial-to-parallel bridge or extra GPIOs for address demux. The 96 ns random-access time sets the initial read latency for code fetch after reset; once the burst engine engages at 100 MHz, sequential reads sustain at the clock rate. The 1.7 V supply rail must be within ±5% for reliable read and program operations — a clean LDO or buck output dedicated to the flash rail avoids read-disturb issues.