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Texas Instruments TPD3S014TDBVRQ1 — Circuit Protection

TPD3S014TDBVRQ1 Zener, Automotive AEC-Q100, SOT-23-6

MPNTPD3S014TDBVRQ1
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Texas Instruments TPD3S014TDBVRQ1, Zener, Automotive AEC-Q100, 3 unidirectional channels, 6V breakdown, -40°C to 125°C, SOT-23-6.

$1.3100Ref. price · indicative, final on quote
Independent supplier — new & surplus stockAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

TPD3S014TDBVRQ1 specifications
ParameterValue
TypeZener
SeriesAutomotive, AEC-Q100
MountingSurface Mount
Voltage - breakdown6V
Power line protectionNo
Operating temperature-40°C~125°C(TJ)
PackageTape & Reel (TR); Cut Tape (CT)
ApplicationsAutomotive
CaseSOT-23-6
Unidirectional channels3

Product details

It is qualified to AEC-Q100, placing it in the automotive-grade component tier for under-hood and cabin electronics. Typical applications include clamping overvoltage transients on sensor inputs, CAN/LIN bus lines, and general-purpose I/O in automotive ECUs.

The 6V minimum breakdown voltage sets the clamping threshold: any signal line exceeding 6V will be shunted through the Zener junction. For a 3.3V or 5V logic rail, this provides a guard band of roughly 1V to 3V above the normal operating level, which is typical for protecting CMOS inputs from load-dump or inductive-kick transients. The three unidirectional channels mean this single SOT-23-6 part can protect three independent signal lines, saving board area versus three discrete Zener diodes. Each channel is unidirectional, so the cathode must be tied to the protected line and the anode to ground — polarity matters in the layout.

For a BOM destined for a production vehicle, this part meets the PPAP documentation requirements that commercial-grade parts do not.

The SOT-23-6 package is a surface-mount footprint common for small-signal protection devices.

Frequently asked questions

Is TPD3S014TDBVRQ1 AEC-Q100 qualified?

Yes, the part is part of the Automotive, AEC-Q100 series, which means it has passed the automotive-grade qualification tests for reliability under extended temperature and stress conditions.