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Microchip Technology DSC6001JI2B-012.0000 — Crystals & Oscillators

DSC6001JI2B-012.0000 MEMS XO 12 MHz AEC-Q100

MPNDSC6001JI2B-012.0000
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Microchip DSC60XXB series MEMS XO, 12 MHz fixed frequency, CMOS output, ±25 ppm stability, AEC-Q100 qualified, 1.8V–3.3V supply, 4-VLGA package.

Independent supplier — new & surplus stockAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

DSC6001JI2B-012.0000 specifications
ParameterValue
TypeXO (Standard)
SeriesDSC60XXB
MountingSurface Mount
Supply voltage1.8V ~ 3.3V
Current - supply1.3mA (Typ)
Frequency12 MHz
Frequency stability±25ppm
Operating temperature-40°C~85°C
Size (Dimension)0.098\" L x 0.079\" W (2.50mm x 2.00mm)
Height - seated0.035\" (0.89mm)
OutputCMOS
PackageTube
RatingsAEC-Q100
FunctionEnable/Disable
Base resonatorMEMS
Case4-VLGA

Product details

Automotive-grade MEMS clock source

The DSC6001JI2B-012.0000 is a MEMS-based XO (standard oscillator) from Microchip's DSC60XXB series, delivering a fixed 12 MHz CMOS output with ±25 ppm frequency stability across -40°C to 85°C.

Package and PCB layout fit

Housed in a 4-VLGA package measuring 2.50mm x 2.00mm with a seated height of 0.89mm, the footprint is compact enough for space-constrained ECU or sensor module layouts. Surface-mount assembly with a standard reflow profile — the small body means the thermal pad under the package must be well-connected to the ground plane for consistent heat dissipation.

Enable/disable function for power management

Frequently asked questions

Does DSC6001JI2B-012.0000 operate at 3.3V?

Yes, the supply voltage range is 1.8V to 3.3V, so it works on a 3.3V rail directly.

What is the footprint of DSC6001JI2B-012.0000?

It uses a 4-VLGA package with dimensions 2.50mm x 2.00mm and a seated height of 0.89mm. The land pattern is standard for a 4-pin VLGA; confirm with the datasheet for exact pad dimensions.

Is DSC6001JI2B-012.0000 AEC-Q100 qualified for automotive?

Yes, it carries AEC-Q100 ratings, making it suitable for automotive applications requiring the associated reliability testing and temperature grade.