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Microchip Technology DSC6001HI2B-002.0800T — Crystals & Oscillators

DSC6001HI2B-002.0800T MEMS XO – 2.08 MHz, AEC-Q100, CMOS

MPNDSC6001HI2B-002.0800T
Active

Microchip Technology DSC60XXB series MEMS XO, 2.08 MHz, CMOS output, ±25 ppm stability, AEC-Q100 qualified, 4-VFLGA package, 1.8V–3.3V supply, -40°C to 85°C.

Independent supplier — new & surplus stockAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

DSC6001HI2B-002.0800T specifications
ParameterValue
TypeXO (Standard)
SeriesDSC60XXB
MountingSurface Mount
Supply voltage1.8V ~ 3.3V
Current - supply1.3mA (Typ)
Frequency2.08 MHz
Frequency stability±25ppm
Operating temperature-40°C ~ 85°C
Size (Dimension)0.063\" L x 0.047\" W (1.60mm x 1.20mm)
Height - seated0.035\" (0.89mm)
OutputCMOS
PackageTape & Reel (TR)
RatingsAEC-Q100
FunctionEnable/Disable
Base resonatorMEMS
Case4-VFLGA

Product details

2.08 MHz MEMS XO with automotive-grade qualification

The DSC6001HI2B-002.0800T is a MEMS-based XO (standard) from Microchip's DSC60XXB series, delivering a 2.08 MHz CMOS output with ±25 ppm frequency stability. The CMOS output connects directly to digital logic without external level translation, simplifying the clock tree.

Supply voltage flexibility and package footprint

The part operates from 1.8V to 3.3V, covering the common digital core and I/O rails in a single BOM line — no need to stock separate 1.8V and 3.3V oscillators. The 4-VFLGA package measures 1.60mm x 1.20mm with a seated height of 0.89mm, fitting space-constrained designs like ADAS cameras or telematics modules.

Frequently asked questions

Is the DSC6001HI2B-002.0800T AEC-Q100 qualified?

Yes, the DSC6001HI2B-002.0800T carries an AEC-Q100 rating, qualifying it for automotive-grade applications. This means it has passed the stress tests and reliability requirements for use in under-hood, cabin, and chassis domains.

Does the DSC6001HI2B-002.0800T have an enable/disable function?

Yes, the function is Enable/Disable, allowing the output to be tri-stated for power management or test modes.