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Microchip Technology DSC1001DI5-060.0000 — Crystals & Oscillators

DSC1001DI5-060.0000 MEMS Oscillator – AEC-Q100, 60 MHz, CMOS

MPNDSC1001DI5-060.0000
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Microchip Technology DSC1001DI5-060.0000, XO (Standard) MEMS oscillator, 60 MHz CMOS output, AEC-Q100 qualified, -40°C to 85°C, ±10 ppm stability, 1.8V to 3.3V supply, 4-SMD no-lead package.

$2.0250Ref. price · indicative, final on quote
Sourced new & surplus through independent channelsAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

DSC1001DI5-060.0000 specifications
ParameterValue
TypeXO (Standard)
SeriesDSC1001
MountingSurface Mount
Voltage1.8V ~ 3.3V
Current - supply7.2mA
Current - supply (Disable)15µA
Frequency60 MHz
Frequency stability±10ppm
Operating temperature-40°C~85°C
Size (Dimension)0.098\" L x 0.079\" W (2.50mm x 2.00mm)
Height - seated0.035\" (0.90mm)
OutputCMOS
PackageTube
RatingsAEC-Q100
FunctionEnable/Disable
Base resonatorMEMS
Case4-SMD, No Lead

Product details

The MEMS base resonator inherently withstands higher vibration and mechanical shock than quartz, which is why this series is often specified for engine control units and transmission controllers where board-level g-forces exceed 50 g.

Operating from 1.8V to 3.3V, this oscillator can be powered directly from a 1.8V MCU I/O rail or a 3.3V peripheral bus without an intermediate LDO — the wide range covers both low-power and legacy logic domains on the same BOM line.

Housed in a 4-SMD, no-lead package measuring 2.50 mm x 2.00 mm with a seated height of 0.90 mm, the DSC1001DI5-060.0000 fits the compact footprint common in automotive sensor modules and telematics units where board space is at a premium. Surface-mount mounting with no-lead terminations means the solder joint is under the package — ensure the PCB land pattern matches the recommended footprint in the datasheet to avoid tombstoning during reflow.

Frequently asked questions

Is DSC1001DI5-060.0000 automotive qualified?

Yes, it carries AEC-Q100 qualification, which means it has passed the automotive-grade reliability tests for temperature cycling, ESD, and latch-up.