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Microchip Technology DSC1001DI2-024.0000T — Crystals & Oscillators

DSC1001DI2-024.0000T – Microchip MEMS XO, 24 MHz, AEC-Q100

MPNDSC1001DI2-024.0000T
Active

Microchip DSC1001 series MEMS XO, 24 MHz, CMOS output, ±25ppm stability, 1.8V–3.3V supply, AEC-Q100 qualified, industrial temp -40°C to 85°C, 4-SMD no-lead package, standby (power down) function.

$1.3800Ref. price · indicative, final on quote
Sourced new & surplus through independent channelsAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

DSC1001DI2-024.0000T specifications
ParameterValue
TypeXO (Standard)
SeriesDSC1001
MountingSurface Mount
Voltage1.8V ~ 3.3V
Current - supply6.3mA
Current - supply (Disable)15µA
Frequency24 MHz
Frequency stability±25ppm
Operating temperature-40°C~85°C
Size (Dimension)0.098\" L x 0.079\" W (2.50mm x 2.00mm)
Height - seated0.035\" (0.90mm)
OutputCMOS
PackageTape & Reel (TR); Cut Tape (CT)
RatingsAEC-Q100
FunctionStandby (Power Down)
Base resonatorMEMS
Case4-SMD, No Lead

Product details

Standby mode and supply flexibility

The supply voltage range of 1.8V to 3.3V covers common digital rails without an external LDO — a single oscillator can serve a 1.8V MCU core and a 3.3V peripheral bus on the same board by tying Vdd to the appropriate rail. Active current draw is 6.3mA max at 24 MHz — low enough for a USB or Ethernet PHY reference clock without exceeding the regulator's thermal budget.

Housed in a 4-SMD, No Lead package measuring 2.50mm x 2.00mm with a seated height of 0.90mm — this is the standard 2.5x2.0mm MEMS oscillator footprint, compatible with many quartz oscillator pads if the layout has room for the smaller body. Surface-mount mounting with a no-lead design means the solder joints are under the package — ensure the PCB land pattern matches the recommended footprint in the datasheet to avoid tombstoning or insufficient fillet height.

Frequently asked questions

Is the DSC1001DI2-024.0000T AEC-Q100 qualified?

Yes, it carries AEC-Q100 ratings, meaning it has passed automotive-grade reliability testing including temperature cycling, ESD, and latch-up — suitable for automotive ECUs and sensors.