Skip to main content
Log in
Microchip Technology DSC1001DI2-022.1184T — Crystals & Oscillators

DSC1001DI2-022.1184T MEMS XO 22.1184 MHz AEC-Q100 CMOS

MPNDSC1001DI2-022.1184T
Active

Microchip Technology DSC1001DI2-022.1184T, MEMS-based XO (Standard), 22.1184 MHz, CMOS output, ±25 ppm stability, AEC-Q100 qualified, 1.8V–3.3V supply, 4-SMD package.

Microchip Technology DSC1001DI2-022.1184T datasheet (PDF)
Independent supplier — new & surplus stockAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

DSC1001DI2-022.1184T specifications
ParameterValue
TypeXO (Standard)
SeriesDSC1001
MountingSurface Mount
Supply voltage1.8V ~ 3.3V
Current - supply6.3mA
Current - supply (Disable)15µA
Frequency22.1184 MHz
Frequency stability±25ppm
Operating temperature-40°C~85°C
Size (Dimension)0.098\" L x 0.079\" W (2.50mm x 2.00mm)
Height - seated0.035\" (0.90mm)
OutputCMOS
PackageTape & Reel (TR)
RatingsAEC-Q100
FunctionStandby (Power Down)
Base resonatorMEMS
Case4-SMD, No Lead

Product details

MEMS resonator, automotive-grade reliability

The DSC1001DI2-022.1184T is a MEMS-based XO (Standard) from Microchip's DSC1001 series, delivering a fixed 22.1184 MHz CMOS output with ±25 ppm frequency stability.

Standby function for power-sensitive designs

Package, supply, and rework considerations

Housed in a 4-SMD, No Lead package measuring 2.50 mm x 2.00 mm with a seated height of 0.90 mm, this oscillator fits tight PCB layouts. Rework note: the no-lead package means hot air is required — don't try an iron. Pin 1 orientation is marked on the package; confirm the pad layout matches the recommended footprint in the datasheet before layout.

Frequently asked questions

Does DSC1001DI2-022.1184T have a standby function?

Yes, the part includes a Standby (Power Down) function that reduces supply current to 15 µA max when the standby pin is asserted.

Is DSC1001DI2-022.1184T AEC-Q100 qualified?

Yes, it carries AEC-Q100 ratings, confirming qualification for automotive applications per the relevant stress and reliability tests.