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Microchip Technology DSC1001BL5-080.0000T — Crystals & Oscillators

DSC1001BL5-080.0000T – Microchip MEMS XO, 80 MHz, CMOS

MPNDSC1001BL5-080.0000T
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Microchip Technology DSC1001BL5-080.0000T, XO (Standard), 80 MHz, CMOS output, ±10 ppm frequency stability, 1.8V–3.3V supply, AEC-Q100 qualified, -40°C to 105°C, 4-SMD No Lead package.

Independent supplier — new & surplus stockAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

DSC1001BL5-080.0000T specifications
ParameterValue
TypeXO (Standard)
SeriesDSC1001
MountingSurface Mount
Supply voltage1.8V ~ 3.3V
Current - supply8.7mA
Current - supply (Disable)15µA
Frequency80 MHz
Frequency stability±10ppm
Operating temperature-40°C ~ 105°C
Size (Dimension)0.197\" L x 0.126\" W (5.00mm x 3.20mm)
Height - seated0.035\" (0.90mm)
OutputCMOS
PackageTape & Reel (TR)
RatingsAEC-Q100
FunctionStandby (Power Down)
Base resonatorMEMS
Case4-SMD, No Lead

Product details

The DSC1001BL5-080.0000T is a MEMS-based XO (Standard) from Microchip's DSC1001 series, delivering an 80 MHz CMOS clock with ±10 ppm frequency stability across a 1.8V to 3.3V supply range.

The 1.8V to 3.3V supply range covers 1.8V, 2.5V, and 3.3V logic rails without an external level translator — a single BOM line serves multiple voltage domains across a platform.

Package, footprint, and layout notes

Housed in a 4-SMD, No Lead package measuring 5.00 mm x 3.20 mm with a seated height of 0.90 mm — a standard 5×3.2 mm oscillator footprint that matches many quartz XO land patterns, simplifying a drop-in MEMS substitution. The CMOS output eliminates the need for external termination resistors required by differential clocks, saving two passives per oscillator on the BOM.

Frequently asked questions

How can I order the DSC1001BL5-080.0000T or request a quote?

The part is supplied on Tape & Reel (TR) per the standard DSC1001 series packaging.

Is the DSC1001BL5-080.0000T AEC-Q100 qualified?

Yes, the DSC1001BL5-080.0000T is rated AEC-Q100, which means it has passed automotive-grade IC qualification including temperature cycling, ESD, and reliability stress testing.