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Microchip Technology DSC1001AI2-108.0000T — Crystals & Oscillators

DSC1001AI2-108.0000T MEMS Oscillator

MPNDSC1001AI2-108.0000T
Active

Microchip DSC1001 series, XO (Standard) MEMS oscillator, 108 MHz, CMOS output, ±25ppm stability, AEC-Q100 qualified, 1.8V–3.3V supply, 4-SMD package.

Microchip Technology DSC1001AI2-108.0000T datasheet (PDF)
Sourced new & surplus through independent channelsAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

DSC1001AI2-108.0000T specifications
ParameterValue
TypeXO (Standard)
SeriesDSC1001
MountingSurface Mount
Voltage1.8V ~ 3.3V
Current - supply8.7mA
Current - supply (Disable)15µA
Frequency108 MHz
Frequency stability±25ppm
Operating temperature-40°C~85°C
Size (Dimension)0.276\" L x 0.197\" W (7.00mm x 5.00mm)
Height - seated0.035\" (0.90mm)
OutputCMOS
PackageTape & Reel (TR)
RatingsAEC-Q100
FunctionStandby (Power Down)
Base resonatorMEMS
Case4-SMD, No Lead Exposed Pad

Product details

108 MHz MEMS oscillator with ±25ppm hold on the clock tree

The DSC1001AI2-108.0000T: That ±25ppm means the clock edge jitter stays inside the timing budget for a 108 MHz bus — no need to oversize the guard band for temperature drift.

AEC-Q100 rated — fits automotive and industrial builds

Product status is Active — Microchip is still manufacturing this order code. The 1.8V to 3.3V supply range lets it drop into 2.5V or 3.3V clock trees without a separate regulator.

7.0×5.0 mm SMD — footprint fits standard oscillator pads

The 4-SMD, No Lead Exposed Pad package measures 7.00mm × 5.00mm — the same footprint as many quartz oscillators, so a board laid out for a 7×5 mm can accepts this MEMS part without a pad revision.

Frequently asked questions

Can the DSC1001AI2-108.0000T replace a quartz oscillator on an existing board?

The 7.0×5.0 mm 4-SMD footprint and CMOS output are standard — if the original quartz oscillator used the same pad layout and output type, the DSC1001AI2-108.0000T is a drop-in replacement. The MEMS resonator is more shock-tolerant, which can improve field reliability in high-vibration environments.