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Microchip Technology DSC1001AC1-033.3333T — Crystals & Oscillators

DSC1001AC1-033.3333T MEMS XO 33.3333 MHz CMOS AEC-Q100

MPNDSC1001AC1-033.3333T
Active

Microchip Technology DSC1001 series MEMS XO (Standard), 33.3333 MHz, CMOS output, 1.8V–3.3V supply, ±50 ppm stability, AEC-Q100 qualified, 4-SMD package, active production.

Microchip Technology DSC1001AC1-033.3333T datasheet (PDF)
Sourced new & surplus through independent channelsAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

DSC1001AC1-033.3333T specifications
ParameterValue
TypeXO (Standard)
SeriesDSC1001
MountingSurface Mount
Voltage1.8V ~ 3.3V
Current - supply7.2mA
Current - supply (Disable)15µA
Frequency33.3333 MHz
Frequency stability±50ppm
Operating temperature0°C~70°C
Size (Dimension)0.276\" L x 0.197\" W (7.00mm x 5.00mm)
Height - seated0.035\" (0.90mm)
OutputCMOS
PackageTape & Reel (TR)
RatingsAEC-Q100
FunctionStandby (Power Down)
Base resonatorMEMS
Case4-SMD, No Lead Exposed Pad

Product details

MEMS oscillator for timing-sensitive automotive and industrial boards

The DSC1001AC1-033.3333T is a MEMS-based XO (standard oscillator) from Microchip's DSC1001 series, delivering a 33.3333 MHz CMOS output with ±50 ppm frequency stability across its 0°C to 70°C operating range.

Wide supply range of 1.8V to 3.3V lets the oscillator run directly from a 1.8V core rail or a 3.3V I/O rail without an external LDO — simplifies the power tree on multi-voltage designs.

Package, footprint, and storage notes

Housed in a 4-SMD, no-lead exposed-pad package measuring 7.00 mm × 5.00 mm with a seated height of 0.90 mm — standard 7×5 mm oscillator footprint, no via-in-pad required.

Frequently asked questions

How can I order the DSC1001AC1-033.3333T or check availability?

Submit an RFQ with your target quantity and required lead time; we confirm current pricing and availability at quote time.

Is the DSC1001AC1-033.3333T AEC-Q100 qualified?

Yes, the DSC1001AC1-033.3333T carries AEC-Q100 qualification, meaning it has passed automotive-grade reliability testing including temperature cycling and ESD stress.