20 V nominal, ±2% — the regulation band that governs the shunt
The 1N6007C is a 20 V zener diode from Microchip Technology, specified with a ±2% tolerance on the nominal voltage — meaning the actual breakdown sits between 19.6 V and 20.4 V at the test current. That tight band makes it a candidate for precision shunt regulation or voltage reference applications where a standard ±5% zener would drift too far across the load range. Rated for 500 mW continuous power dissipation in free air, the DO-35 glass package (DO-204AH) keeps the junction within the -65°C to +175°C operating envelope — wide enough for bench instrumentation, industrial control boards, or avionics secondary-side references where the ambient swings with the enclosure.
Zener impedance and leakage — the load-regulation reality
Maximum zener impedance (Zzt) is 48 Ohms at the nominal voltage. This is the dynamic resistance the load sees — a 10 mA change in zener current shifts the output voltage by roughly 480 mV, so the part works best where the load current is stable or where a series resistor sets the bias current well above the knee. Reverse leakage is specified at 100 nA maximum when biased at 15 V, which is 5 V below the breakdown knee. That low leakage means the diode draws negligible current in the off state — useful in battery-powered threshold detectors or crowbar circuits where standby power is budgeted in microamps. Forward voltage is 1.1 V maximum at 200 mA — typical for a silicon junction in this current range. The forward characteristic is secondary for a zener used in reverse breakdown, but matters if the part is pressed into service as a general-purpose rectifier or clamp in a prototype.
Active production — no last-time-buy pressure
Supplied in bulk (non-tape-and-reel), the DO-35 axial-lead package is through-hole mounted — a straightforward fit for existing PCB layouts using 0.025-inch diameter holes. The glass hermetic seal gives the junction protection against moisture ingress, which is relevant for conformal-coated boards or humid environments.