NXP LPC12D27FBD100/301551 ARM Cortex-M0 MCU 45MHz 128KB Flash 100-LQFP
NXP LPC1200 series, 32-bit ARM Cortex-M0 single-core at 45 MHz, 128 KB flash, 8 KB SRAM, 8×10-bit ADC, 40 I/O, I²C/SPI/UART/IrDA/SSP, internal oscillator, 3–3.6 V, -40°C to 85°C, 100-LQFP (14×14 mm).
- 100% new & originalTraceable channels only — no refurbs, no pulls, no remarked parts.
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Specifications
| Parameter | Value |
|---|---|
| Series | LPC1200 |
| Mounting type | Surface Mount |
| Oscillator type | Internal |
| Program memory type | FLASH |
| Voltage - supply (Vcc (Vdd)) | 3V ~ 3.6V |
| Operating temperature | -40°C~85°C(TA) |
| Speed | 45MHz |
| Package | Bulk |
| RAM size | 8K x 8 |
| Core size | 32-Bit Single-Core |
| Peripherals | Brown-out Detect/Reset, DMA, LCD, POR, PWM, WDT |
| Connectivity | I²C, IrDA, SPI, SSP, UART/USART |
| Number of i (O) | 40 |
| Core processor | ARM® Cortex®-M0 |
| Case | 100-LQFP |
| Data converters | A/D 8x10b |
| Program memory size | 128KB (128K x 8) |
Frequently asked questions
Is the LPC12D27FBD100/301551 a direct drop-in replacement for the LPC1227FBD100 in an existing design?
Both are ARM Cortex-M0 at 45 MHz in 100-LQFP, but they are different silicon die within the LPC family — peripheral register maps, clock architecture, and flash algorithm differ. A firmware port is not guaranteed drop-in; verify the LPC1200 and LPC1220 family user manuals and compare register headers before committing the swap.
At 75 °C panel ambient, do I need to derate the I/O current-sink rating during a full 128 KB flash write cycle?
The part is rated -40°C to 85°C TA. At 75 °C the die is running near its ceiling — the I/O sink current derating during a flash write cycle should be verified against the thermal curves in the NXP LPC1200 datasheet, particularly if multiple I/O are simultaneously sinking during the write algorithm.