AEC-Q100 Grade and temperature envelope
The MT53E256M16D1DS-046 AAT:B: This part carries an Automotive, AEC-Q100 qualification — not just an automotive-screened part but a device designed and validated to the full AEC-Q100 stress suite for automotive ICs. An OEM auditor will expect PPAP documentation at the AEC-Q100 level; the AAT:B suffix signals the automotive temperature and test flow variant from Micron.
At 2.133 GHz clock frequency, this LPDDR4 device delivers 4266 MT/s data rate on a 16-bit bus — the 256M x 16 organization gives 8.5 GB/s peak bandwidth per chip. The 1.1V supply rail keeps the I/O and core power within the mobile/automotive low-power budget; at this speed the signal integrity on the board trace routing from the SoC to the WFBGA balls becomes the limiting factor, not the DRAM core.
Surface-mount only; the tray packaging indicates the part ships in matrix trays for automated pick-and-place, not tape-and-reel.
Sourced through authorized distribution channels; availability and current pricing confirmed against an RFQ for the BOM quantity.