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Murata Electronics DFE2HCAHR33MJ0L — Inductors & Chokes

Murata DFE2HCAHR33MJ0L 330nH Shielded Inductor, 4.9A

MPNDFE2HCAHR33MJ0L
Active

Murata Electronics DFE2H series, Drum Core Wirewound, Shielded, 330 nH, ±20%, 4.9 A, 21mOhm Max, Surface Mount, 1008 (2520 Metric), AEC-Q200.

$0.6900Ref. price · indicative, final on quote
Sourced new & surplus through independent channelsAuthenticity-screened · ESD-safe packingListing updated Aug 2026

Specifications

DFE2HCAHR33MJ0L specifications
ParameterValue
TypeDrum Core, Wirewound
SeriesDFE2H
MountingSurface Mount
Current rating4.9 A
Current - saturation5.8A
Inductance frequency - test1 MHz
Operating temperature-40°C ~ 150°C
Material - coreMetal
Size (Dimension)0.098\" L x 0.079\" W (2.50mm x 2.00mm)
Height - seated0.047\" (1.20mm)
PackageTape & Reel (TR) Cut Tape (CT)
RatingsAEC-Q200
ShieldingShielded
Tolerance±20%
Inductance330 nH
Case1008 (2520 Metric)
DC resistance21mOhm Max

Product details

330 nH shielded power inductor for automotive and industrial DC-DC

The Murata DFE2HCAHR33MJ0L is a 330 nH shielded wirewound inductor from the DFE2H series, housed in a 1008 (2520 Metric) surface-mount package. It is qualified to AEC-Q200, meaning it meets the stress and reliability requirements for automotive-grade passive components. Rated for 4.9 A continuous current with a saturation current (Isat) of 5.8 A, the part delivers useful headroom for steady-state and transient loads in DC-DC converter output filters. The 21 mOhm maximum DCR keeps conduction losses low — at 4.9 A the I²R loss is about 0.5 W, manageable in the 1008 footprint without excessive temperature rise.

AEC-Q200 grade and 150°C rating for under-hood and engine-bay designs

AEC-Q200 qualification covers passive component stress tests including thermal shock, humidity bias, and vibration — the DFE2HCAHR33MJ0L is suited for automotive power trains, ADAS power supplies, and industrial systems where the ambient temperature reaches 125°C or more. The metal composite core and shielded construction keep EMI within the enclosure and support high-frequency switching up to and beyond 1 MHz test frequency.