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Bourns Inc. CD1408 Series

10 variants · Bourns Inc.

About the Bourns Inc. CD1408 Series

The Bourns Inc. CD1408 Series series groups 10 related part numbers, each listed with full specifications, a datasheet where available, and an RFQ option. The listed variants share a common case of Chip, Concave Terminals, current - average rectified of 1A and diode type of Standard. Variants differ by current - reverse leakage @ vr, reverse recovery time and speed, so you can match the exact current - reverse leakage @ vr your application requires using the selection guide below.

Select a variant by

Current - reverse leakage @ vr
1 µA @ 1000 V · 2 µA @ 200 V · 5 µA @ 800 V · 5 µA @ 1000 V
Reverse recovery time
3 µs · 35 ns · 75 ns · 300 ns
Speed
Fast Recovery =< 500ns, > 200mA (Io) · Standard Recovery >500ns, > 200mA (Io)
Voltage - DC reverse (Vr)
200 V · 800 V · 1000 V
Voltage - forward (Vf) (Max) @ if
1 V @ 1 A · 1.3 V @ 1 A · 1.7 V @ 1 A · 2.5 V @ 1 A · 930 mV @ 1 A
Capacitance @ vr,
10pF @ 4V, 1MHz · 12pF @ 4V, 1MHz · 15pF @ 4V, 1MHz

Shared specifications

Case
Chip, Concave Terminals
Current - average rectified
1A
Diode type
Standard
Mounting
Surface Mount
Operating temperature - junction
-65°C ~ 175°C
Package
Tape & Reel (TR); Cut Tape (CT)

Variant comparison

ParameterCD1408-F11000CD1408-FF11000CD1408-FU1200CD1408-FU1800CD1408-R11000
Current - reverse leakage @ vr5 µA @ 1000 V5 µA @ 1000 V2 µA @ 200 V5 µA @ 800 V1 µA @ 1000 V
Reverse recovery time300 ns75 ns35 ns35 ns3 µs
SpeedFast Recovery =< 500ns, > 200mA (Io)Fast Recovery =< 500ns, > 200mA (Io)Fast Recovery =< 500ns, > 200mA (Io)Fast Recovery =< 500ns, > 200mA (Io)Standard Recovery >500ns, > 200mA (Io)
Voltage - DC reverse (Vr)1000 V1000 V200 V800 V1000 V
Voltage - forward (Vf) (Max) @ if1.3 V @ 1 A1.7 V @ 1 A930 mV @ 1 A2.5 V @ 1 A1 V @ 1 A
Capacitance @ vr,15pF @ 4V, 1MHz10pF @ 4V, 1MHz10pF @ 4V, 1MHz12pF @ 4V, 1MHz

Request a quote on any Bourns Inc. CD1408 Series part number and we confirm price, availability and lead time per line — including end-of-life and allocation-constrained variants.

All variants